ISO 13320-1 PDF

ISO INTERNATIONAL. STANDARD. ISO. First edition .. Since the publication of ISO , the understanding of light. ISO (E). INTERNATIONAL. STANDARD. ISO. First edition . Particle size analysis — Laser diffraction methods —. Part 1. Scope. This part of ISO provides guidance on the measurement of size distributions of particles in any two-phase system, for example powders, sprays.

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You 13320–1 may like to try some of these bookshopswhich may or may not sell this item. It does not address the specific requirements of particle size measurement of specific products. Found at these bookshops Searching – please wait Comments and reviews What are comments?

This single location in All: Types of output, e. This single location in Victoria: Then set up a personal list of libraries from your profile page by clicking on your user name at the top right of any screen. To include a comma in your tag, surround the tag with double quotes.

BS ISO 13320-1:1999

None of your libraries hold this item. View online Borrow Buy Freely available Show 0 more links Part 1, General principles ; Part 2, Validation of inversion procedures”–Foreword, p.

Set up My libraries How do I set up “My libraries”? Industriestrasse 8 Idar-Oberstein. Specification NanoTec Measuring range, overall and during each analysis 0.


isp Specification NanoTec Number of elements 51 Geometry e. Open to the public ; We were unable to find this edition in any bookshop we are able to search.

Specification NanoTec Depth of the measuring plane in laser beam 4 mm Liquid pump rate 6. Lists What are lists? Skip to content Skip to search. The international standard ISO izo Size Analysis — Laser Diffraction Methods” describes the methods for the determination of particle size distribution via laser diffraction.

Public Private login e. This part of ISO is applicable to particle sizes ranging from approximately 0,1 um to 3mm. Physical Description v, 34 p.

BS ISO – Particle size analysis. Laser diffraction methods. General principles

Login to add to list. Add a tag Cancel Be the first to add a tag for this edition. Segments Alignment automatic oder manual automatic and manual Detector elements calibrated yes Lower detection limit for small amounts and of small and large particles yes Overload level for detector elements 12Bit, Be the first to add this to a list.

All laser diffraction instruments for particle size measurement can be compared worldwide based on this table. Lower detection limit for small amounts of small and large particles in size distributions with measuring range. Subcommittee SC 4, Sizing by methods other than sieving. Specification NanoTec Typical measuring time 10 s Minimum time between measurements 2 min.

Specification NanoTec Calculation of model matrix yes Multiple scattering calculation yes, internal Type of optical models that can be applied Mie, Fraunhofer Indicative description of mathematical methods for example weighting, bounding, grading Regularization.


ISO – Particle size analysis — Laser diffraction methods

Separate different tags with a comma. Home This edition, English, Book, Illustrated edition: Tags What are tags? These online bookshops told us they have this ido Check copyright status Cite this Title Particle size analysis — laser diffraction methods.

In order to set up a list of libraries that you have access to, you must first login or sign up. For non-spherical particles, and equivalent-sphere size distribtution is obtained because the technique uses the assumption of spherical particles in its optical model. Part 1, General principles. Indicative description of mathematical methods for example weighting, bounding, grading. Laser beams — Diffraction — Standards. Table of the technical specifications demanded according to ISO ISO consists of the following parts, under the general title isi size analysis — laser diffraction methods’: Subjects Particle size determination — Methodology — Standards.

Particle ieo analysis — laser diffraction methods.

The resulting particle size distribution may be different from those obtained by methods based on other physical principles e.